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Automatic 32-Sample XRF Scanning System for High Throughput Composition Analysis of New Materials - EQ-XRF-32-LD


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Item Number: EQ-XRF-32-LD
Transported by LTL Freight (Truck)

Personalization

EQ-XRF-32-LD is a high throughput, automatic 32-sample X-ray fluorescence (XRF) / energy dispersive spectrometer (EDS) system for non-destructive composition analysis. The station integrates a handheld XRF spectrometer with XY stage, 32-sample station and laptop remote control. It enables quick and easy composition analysis of samples (elements from Mg to Bi), with concentration as low as 0.01%. The system automation provides 32-sample testing, analysis, result output in one auto run with the push of a single button. It is an excellent tool for high throughput research and development of powder and bulk materials, for applications such as high-entropy alloys, novel magnetic materials, solid ceramic electrolyte materials, etc

SPECIFICATIONS:
Features




  • The high throughput XRF station consists of:
    • Handheld XRF spectrometer
    • XRF spectrometer holder and triggering mechanism
    • XY stage system and its control box
    • 32-position transparent sample stage (no interference to XRF signal)
    • Laptop with pre-installed control and analysis software
    • Station cabinet with warning lights and lead glass for X-ray safety
  • The automatic operation improves efficiency, reduces operator related error, and minimize X-ray exposure
  • Fast, automatic XRF measurement and analysis of 32 samples (~20 min depending on the testing time), and automatic output of composition/spectrum data via a USB port
  • The XRF system can be upgraded with 1D line scan and 2D mapping scan features at the extra cost 
  • Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove-box, etc
Power Input
XRF Spectrometer

     
 
 

  • X-ray Source:
    • X-ray tube: 4 W Rh target X-ray tube (optional Ag, Au, or Ta target available)
    • Voltage: 40 kV max (50 kV option available)
    • Current: 200 μA max
    • Spot size: 3 mm (with collimator) and 9 mm 
    • Window Material: Beryllium (Be)
    • Window guard: Kapton and Prolene window protection films
  • Detector:
    • SDD (Silicon drift detector): High energy resolution (165 eV FWHM) for general detection covering the whole element range
    • Detector size: 25 mm2 large area detector for high count rate
    • Window Material: Beryllium (Be)
  • Features:
    • An element library for alloy elements are pre-installed: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi (Customized element library is available upon request)
    • Integrated CMOS camera for observing the measurement area on the sample surface
    • Built-in sample proximity sensor to close X-ray shutter if no sample is detected near the detector
    • USB / Bluetooth connection to a laptop for remote control and data output
XRF Holder & Trigger

  • A XRF spectrometer holder with trigger-pressing mechanism is integrated into the system for continuous, automatic measurement
  • The XRF measurement time can be controlled by setting the press-down time of the trigger mechanism
XY Sample Stage
  

  • Touch screen controlled XY stage for precise sample positioning and measurement repeatability
  • XRF measurement time, X- / Y- axis travel speed, sample selections can be configured on the control box touch screen
  • 32-sample transparent stage (no interference to XRF signal) for as-received arc melting samples (≤10 g) (max sample size: 20 mm) is included
  • 32-sample stage for cold embedded metal / alloy samples (max sample size: 26 mm, spacing 30 mm) is included
  • The sample is supported by XRF transparent Prolene film for maximized XRF signal
                 
Station Cabinet
 

  • Station cabinet with warning lights and lead glass for X-ray operation safety
  • XY stage control box is integrated to the station cabinet
  • An optional high accuracy digital Geiger counter/dosimeter can be mounted on the cabinet for monitoring the radiation level (Click the photo below)
          
XRF Control & Analysis





  • Laptop with pre-installed XRF control software and spectrum analysis software are included for XRF spectrometer remote control and data analysis
  • The control/analysis software is capable of 
    • Adjust measurement settings: X-ray voltage/current, testing time, spot size, measurement repeats
    • Real-time observation of measurement area on the sample surface using the integrated CMOS camera
    • Default element library for alloy element: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi
    • Customized element library (up to 40 elements) for ceramic analysis or other applications is available upon request
    • Fundamental parameters analysis, both qualitatively and quantitatively
    • Full correction on attenuation in air and absorption of window/window guard 
    • Auto-mode for continuous or repeated analysis
Options

  • The XRF system can be upgraded with 1D line scan and 2D mapping scan features at extra cost
  • Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove-box, etc
Net Weight
  • 120 kg
Compliance
  • XRF spectrometer: CE, FCC (USA), ICES-001 (Canada) approval 
             
  • EQ-XRF-32-LD is CE certified.
Warranty
  • One-year limited warranty with lifetime support
Dimension

  • 820 × 680 × 1200 mm (L × D × H)  (Depth with door open: 1050mm)
Operation Instructions & Video
Application Notes
  • Users must be trained in radiation safety and fully understand the radiation precautions and instructions provided
  • Beware of the X-ray beam! DO NOT point X-ray beam to anybody including yourself at all time!
  • Close the cabinet door and stay 0.5 m clear of the cabinet before conducting XRF measurement to minimize radiation

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Notices
1. Prices listed online are valid for US market and whom pay by credit card only. There will be extra charges for shipping & handling. Price various from country to country.
2. We may add extra charges for paper order and net30 terms due to extra labor cost.
3. The prices listed are subject to change without notice.