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3'' Aluminum Nitride Substrate for RTP Furnace's Sample Holder - EQ-AIN-Holder
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Click to enlarge
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In stock
Item Number: EQ-AIN-Holder
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Such unpolished Aluminum Nitride can be placed in the center of holder for holding test
samples up to 3’’ diam. The excellent temperature uniformity can be achieved in this 3’’
diam. area due to the benefit from its high thermal conductivity.
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Aluminum Nitride Ceramic Substrates Properties
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Item No.
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AIN-Holder
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Purity (wt%)
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99%
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Density (g/cm3)
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>3.26
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Thermal Conductivity (W/m. K)
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>170
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Thermal Expansion (x10-6/oC)
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<4.2
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Dielectric Strength (Kv/mm)
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>15
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Dielectric Constant (at 1MHZ)
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8.7
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Loss Tangent (x104@1 MHz)
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3 - 7
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Volume Resistivity (ohm-cm)
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>1014
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Flexural Strength (Kgf/mm)
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>30
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Substrate Specifications
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3’’ diameter, 0.65mm thickness
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Product Configuration
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The unpolished AIN in the center of holder is able to hold test samples up to 3’’ diam.
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MS&T 2012, Booth# 536, Oct.9-10, 2012, Pittsburgh, PA, USA
 Nanotech 2012, Booth# 712, June 19-20, 2012, Santa Clara, California
 MRS 2012 Spring Meeting, Booth# 321, Apr. 10-12, 2012, San Francisco, CA , USA
 TMS 2012, Booth# 330, Mar. 12- 14, 2012, Orlando, FL, USA
 APS 2012, Booth#211, Feb.27-29, 2012, Boston, MA, USA
 AABC 2012, Booth #809, Feb 6-10, 2012,Orlando, FL, USA
 36th ICAE/ICACC 2012, Booth#214, Jan.24-25, 2012, Daytona Beach, FL, USA
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Notices
1. The price listed on line is valid for US market and who pay by credit card only. There will be extra cost for shipping and handling. The price is different from country to country
2. We may add extra cost for paper order and net 30 term due to extra labor cost
3. The price is subject to change without notice
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