Browse Categories
Search

Automatic 32-Sample Rockwell Hardness Testing System for High Throughput Hardness Analysis - EQ-RHT50-32-LD


Please email for lead time
Item Number: RHT5032

EQ-RHT50-32-LD is high throughput, automatic 32-sample Rockwell hardness testing system for high throughput new alloy development and process optimization. The station integrates a Rockwell hardness tester probe with XY stage, 32-sample station, and laptop remote control. It enables quick, easy, and accurate hardness testing of samples without the need of material-dependent calibration. The measured HV hardness can be automatically converted to HB, HRA, HRB scales. A 50 N test load probe is included for hardness tests ranging from 19 - 70 HRC (35 - 1000 HV).

SPECIFICATIONS

Features


  • The high throughput Rockwell hardness testing system consists of:
    • Hardness tester probe with 50 N test load for 19 - 70 HRC (35 - 1000 HV) test
    • Hardness tester probe holder and triggering mechanism
    • XY stage system and its control box
    • 32-position sample stage
    • Laptop with pre-installed control and analysis software
  • The automatic operation improves efficiency, reduces time, and minimizes operator related error
  • Fast, automatic hardness testing and analysis of 32 samples (~20 min), and automatic output of hardness data via a USB port
  • The hardness testing system can be upgraded with 1D line scan and 2D mapping scan features at extra cost 
  • Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove-box, etc
Test Method
 
  • Portable Rockwell static test method: a diamond indenter is forced into the sample and the indentation depth is automatically analyzed to determine the hardness.
  • The indentation depth is continuously measured while a load is applied and released. From the depth difference between pre-load and total load conditions (See the first photo below), sample hardness is determined
  • Compared to traditional rebound and ultrasonic hardness testing method, TIV method does not require Young's modulus calibration for different materials, enabling direct, fast, and accurate measurement of sample hardness
            
Probe
 
  • A tester probe with 50 N test load is included for 19 - 70 HRC (35 - 1000 HV) test
  • Measuring time: ~5 - 10 sec
  • USB interface for test data output and remote control
  • A digital camera with a laser pointer is integrated for indicating the hardness testing spot on the sample surface and recording the testing spot by saving the image
XY Stage


  • Touch screen controlled XY stage for precise sample positioning and measurement repeatability
  • Hardness measurement time, X- / Y- axis travel speed, sample selections can be configured on the touch screen
  • 32-sample stage with 26 mm cavities is included for testing cold embedded alloy samples 
          
Testing Software

  • Automatic hardness conversion according to DIN 50157, ASTM E140, ISO EN 18265 standards
  • Six hardness scales: HRC (default), HV, HB, HRA, HRB scales
Sample Requirement
  • Sample thickness: > 1 mm
  • Sample size: > 1 mm Dia.
  • Sample weight: no restriction
  • Sample surface roughness: < Ra 2.0 um
  • For high throughput preparation of sample surface, please choose MTI's 16-Sample Automatic Polishing Machine Unipol-1500-S16
Operation Temperature
  • 0 - 40 ℃
Instruction Video           
         
Warranty
  • 1 years warranty with lifetime support



Related Products

Shopping Cart
Your cart is empty.
Please clear the browsing history before ordering the product. Otherwise, availability and price are not guaranteed.
Mailing Lists
MTI sponsorships:
MTI Sponsors Thermoelectrics Workshop

MTI-UCSD Battery Fabrication Lab

MTI Sponsors the Postdoctoral Awards


Upcoming Shows:

243rd ECS Meeting May 28 - June 2 Boston MA Booth 231

AABC Europe 2023 June 19 - 22 Mainz Germany Booth 602

ICT 2023 June 21 - 25 Seattle WA

Recent Attended Shows:
2023 MRS Spring Meeting April 11-14 San Francisco CA Booth 104

40th International Battery Seminar Exhibit March 20-23 2023 Orlando FL Booth 121 


TMS 2023 March 19 - 23 San Diego CA Booth 609 

Click here to see our past conferences

 
Notices
1. Prices listed online are valid for the US market and who pay by credit card only. There will be extra charges for shipping & handling. Prices vary from country to country.
2. We may add extra charges for paper orders and NET 30 terms due to extra labor costs.
3. The prices listed are subject to change without notice.